QIP Short Term Course on
TEM and HRTEM Analysis of Materials
2-6 September, 2019
Imaging at atomic resolution and elemental analysis at nanoscale has become essential characterization in advanced materials processing, development, and design. The range of experimental techniques available have been increasing and the researchers need to develop a high degree of expertise, both in the conduct of the analysis using these tools and interpretation of the acquired data/results. The lack of exposure and expertise in these techniques is becoming more and more a limitation in carrying out the high quality of research using these advanced research tools/techniques. This course aims to address this shortcoming.
The course will start with fundamentals of TEM and discussion of all the basic techniques and their typical applications. Both the theoretical aspects and practical applications will be discussed. Highlighting the advances in electron microscopy, it will also provide case studies of some challenging and precise analyses that is possible. The course is designed to cater both the aspiring as well as advanced researchers looking for an insight into the atomic/nano-/micro-scale details of materials. The objectives of the course are:
To give the basic understanding and an overview of advances in a range of techniques for nanostructures and nanoscale composition analysis.
With practical and demonstrations, provide firsthand feel for designing and carrying out experiments/ analysis on using these tools and techniques.
Data analysis and interpretation with a range of selected case studies.
The course will cover nano-characterization tools and Techniques viz. TEM, STEM/HAADF, HRTEM, electron tomography and nano-analysis with EDS, EELS. Major topics to be covered are:
1. Fill in google form and obtain approval to participate.
2. After approval fill in registration form and get signatures.
3. Send completed form along with the registration fee.
The payments should be made through SBI Collect. For details of SBI Collect payment information please Click Here
For information on how to pay by SBI Collect, please Click Here
A maximum of 30 QIP participants and 10 senior Ph. D students will be selected and the participants need to send a letter from their Head of the Institute/Department, in support of their application. Ph.D Students should route their application through supervisor/HOD
| 1. Faculty from AICTE Institutes coming under QIP program (refundable only on participation) Polytechnic Teachers are not allowed under QIP category |
Rs. 1000 |
| 2. Faculty from private/autonomous Institutions: | Rs. 10000 + Rs. 1800 GST Rs. 11,800 |
| 3. Ph.D Students of IITK | Rs. 3000 Rs. 3,000 |
| 4. Ph.D Students from Educational Institutions: | Rs. 6000 + Rs. 1080 GST Rs. 7,080 |
| 5. Participant from Industry and R&D labs: | Rs. 15000 + Rs. 2700 Rs. 17,700 |
Food is being arranged in VH dining hall for all the registered participants. Breakfast, lunch, dinner will be provided. Tea/coffee and snacks will be provided at the venue during breaks. VHE is located 1 km from VH extension. Venue for lecture session is located within VH premises.
Accommodation in Visitors Hostel Extension (VHE) will be arranged only for participant from outside Kanpur city on advance request at the time of application itself. For all QIP participants accommodation charges will be borne by QIP Program funding. All other participants and student have to pay for accommodation by themselves. The guest room occupants should agree to abide by the existing rules and regulations of VHE, IITK.
Challenges and advances - Macro-, Micro-, Nano- to Atomic scale characterisation tools and techniques
Amplitude contrast; mechanism of mass-thickness contrast, Z-contrast; STEM diffraction contrast; artifacts in images; planar defects; strain fields contrast; dislocations and interfaces; volume defects and particles.
Practical aspects of diffraction and diffraction pattern analysis Reciprocal Lattice; Laue concept and their Relation to Bragg’s Law; stereographic projection, Excitation Error, SAD Techniques, Indexing Single-Crystal DPs, Ring Patterns from Polycrystalline Materials, Hollow-Cone Diffraction, Diffraction from Amorphous Materials
Fourier transforms and imaging, Transfer Function and Scherzer Defocus. ACTEMs and the Information Limit.
Image Simulation: Modeling the Structure, Calculating Images of Defects, Simulating Z-Contrast
Elemental mapping and Electron tomography
Quantitative X-ray Analysis; Practical Steps for Quantification
Acquiring X-ray Spectra and their interpretation
Qualitative and Quantitative X-ray Imaging : Principles and Practice
Typical examples of x-ray mapping and interpretation
Acquiring EELS Spectrum and its interpretation Low-Loss Spectrum and applications: Chemical Fingerprinting, EFTEM imaging with ionization edge: Qualitative and quantitative analysis
Metallic self-supporting samples: Electropolishing, Ceramics and electronic devices: Cross-sectional specimen preparation: Ion Milling, Soft materials, polymers, biological specimens: Ultramicrotomy, Nano-particles, fibers, FIB, Plasma Cleaners