Probe Station

RCA Cleaning

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- Thermal Evaporator
- Spin Coater `
- Ultrasonicator
- Characterization Setup
- Traps signature in steady state current-voltage characteristics of organic diode, Rizvi, S. M. H. and Mantri, P. and Mazhari, B., Journal of Applied Physics, 115, 244502 (2014)
- Prachi Mantri, S.M.H. Rizvi, B. Mazhari, Estimation of built-in voltage from steady-state current-voltage characteristics of organic diodes, Organic Electronics, Volume 14, Issue 3, August 2013, Pages 2034-2038.
- Vinay Kumar Singh and Baquer Mazhari, Measurement of threshold voltage in organic thin film transistors, Appl. Phys. Lett. 102, 253304, June 2013.
- Arun Tej Mallajosyula, S. Sundar Kumar Iyer, Baquer Mazhari, Charge transport in polythiophene: fullerene: nanotube bulk heterojunction photovoltaic devices investigated by impedance spectroscopy, Current Applied Physics, June 2013
- M. N. Islam and B. Mazhari, Organic Thin Film Transistors with Asymmetrically Placed Source and Drain Contact, Organic Electronics, Volume 14, Issue 3, March 2013, Pages 862-867.
- Ashish K. Agarwal, and B. Mazhari, Simultaneous Extraction of Source and Drain Resistances in Top Contact Organic Thin Film Transistors From a Single Test Structure, Organic Electronics: physics, materials, applications 13 (11) , pp. 2659-2666, Nov. 2012.
- Mallajosyula, Arun Tej, Iyer, S. Sundar Kumar; Mazhari Baquer, Capacitance-voltage characteristics of P3HT:PCBM bulk heterojunction solar cells with ohmic contacts and the impact of single walled carbon nanotubes on them, Org. Electronics, Volume 13, Issue 7, July 2012, Pages 1158-1165.
- Vinay K. Singh, Baquer Mazhari, Impact of scaling of dielectric thickness on mobility in top-contact pentacene organic thin film transistors , J. Appl. Phys. 111, 034905 , Feb 2012
- Vinay K. Singh, Ashish K. Agarwal and Baquer Mazhari, Measurement of Source Resistance in Top Contact Organic Thin Film Transistors, IEEE Electron Device Lett., EDL-9, March 2012
- Vinay K. Singh, Baquer Mazhari, Accurate characterization of organic thin film transistors in the presence of gate leakage current, AIP ADVANCES 1, 042123 (2011)
- Rajesh Agarwal
- Syed Rizvi
- Nadeem Firoz
- Peeyush
- Nama Jain
- Saurabh
- Anubhav
- Pankaj
- Abhinay
- Shobhojit
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