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Talks & Demo -JEOL

JEOL has received the support from many people since our founding in May 1949 as an electron microscope development company, and celebrated our 70th anniversary in May 2019. know more

Speakar: Dr. Tetsuo Oikawa

Title: In-situ observation in aberration corrected TEM
Designation: Ph D
Affiliation: JEOL Asia Pte. Ltd.
Areas of Interest: Electron Microscopy
Awards: Technology Development Award (1996, The Japan Institute of Metals and Materials)
Books/Book chapters: D. Shindo and T. Oikawa, Analytical Electron Microscopy for Materials Science, (Springer-Varlag, Tokyo, 1998)

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