Electron microscopy has become the most widely used characterization tool by researchers in advanced materials processing/development/design. The range of experimental techniques available is really broad and requires varying degree of expertise, both in the conduct of the analysis and interpretation of the acquired data/results. Some of the techniques are highly demanding and sophisticated enough to make their usage impossible without rigorous training and experience. The lack of exposure and expertise in these techniques is becoming more and more a limitation in carrying out the highest possible quality of research using the presently available research infrastructure. This course aims to address this lacuna in our education and training.


The course will focus mainly on two characterization techniques viz. Scanning Electron Microscopy (SEM) and Micro-Compositional Analysis in a fairly comprehensive manner. Fundamentals of Transmission Electron Microscopy and Miro-compositional analysis will also be covered briefly.

Scanning Electron Microscopy
  • Basic modes of imaging: SE and BSE
  • X-ray Energy dispersive spectroscopy (EDS)
  • EBSD/OIM in micro-texture analysis
  • Fractography and failure analysis
  • Focused Ion Beam (FIB) and its applications
  • In-situ studies in SEM
Electron Micro-Probe Analysis (EPMA)
  • Comparison: EDS vs WDS
  • Qualitative Vs Quantitative analysis
  • X-ray data analysis Modes
  • Detailed quantification procedure including ZAF correction
Transmission Electron Microscopy (TEM)
  • Imaging: BF, DF and WB-DF
  • Electron diffraction: SAED, CBED, etc.
  • Phase contrast imaging - HRTEM
  • Chemical analysis: EDS and EELS

A series of lectures, tutorials and lab sessions will be delivered by the experts from IIT-Kanpur. It will cover the fundamentals as well as applications of complete range of techniques.