LECTURE CONTENTS
| Fundamentals | ||
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| Lecture-1: Introduction to Microscopy | ||
| Scanning electron microscope (SEM) | ||
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Lecture-1: Fundamentals of SEM Lecture-2: Basic Principles of OIM and Applications in Materials Analysis Lecture-3: Advanced Analysis (In-situ, Electron Channeling contrast, EBIC) Lecture-4: Micro-textural analysis Lecture-5: Fractography and failure analysis Lecture-6: FIB and in-situ compression testing |
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| Basics of Transmission electron microscope (TEM) | ||
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Lecture-1: Fundamentals of TEM and applications Lecture-2: Quantification by EDS/EELS in TEM |
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| EPMA and Microanalysis | ||
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Lecture-1: Fundamentals of EPMA Lecture-2: Quantification using EPMA |
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| TUTORIAL | ||
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Tutorial-1 on Quantification (ZAF) Tutorial-2 on EPMA data Tutorial-3 on SEM Image Interpretation and Quantification |
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| PRACTICAL/ DEMO SESSIONS | ||
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| Practical/Demo sessions will be planned to cover all aspects of microscopy and microanalysis with ample illustrative samples. | ||
Kaustubh Kulkarni
Course Coordinator