Atomic Force Microscopy (AFM) integrated with Friction Force Microscopy (FFM) and Nano Indentation

Model: Xe7 from Park System South Korea
 

  • XE7 Atomic Force Microscope is capable of scanning sample for lowest noise and gives best resolution image.

  • This system works with new generated software techniques, such as XEP (Data Analysis and Optical View), XEI (Image Processing) and XEL (Lithography Analysis).

  • The system includes the Contact Mode, Non Contact Mode, Lateral / Friction Force Microscopy Mode, Magnetic Force Microscopy Mode, Lithography Mode, and Nano Indentation Mode (Nano Indentor up to 20 mN).

  • The resolution of the system is 1.5 nm (Close Loop) and < 0.01 nm (Open Loop). Sample size is 100 × 20 mm.

Location


Tribology & Surface Engineering Laboratory, NL - 1
Dept. of Mechanical Engineering

Contact


Prof. Arvind Kumar
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User Charge


Rs. 1000 per slot for normal tip
Rs. 2000 per sample for nano indentation/MFM/Lithography/FFM (Service Tax is
Applicable for outside IITK users