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Inverted Microscope
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Confocal and reflected mode operation
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Individually controllable continuous wave lasers
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Ar, 65mW: 458, 476, 488, 514 nm;
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HeNe, 20 mW: 543: Green
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HeNe, 2 mW: 633: Red
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Multi-dimensional image capture in Space (X,Y,Z) and time (t)
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Conventional scanning at 5 FPS at 512 X 512 pixels to 54 fps at 512 x 16 pixels
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Typical resolution in X, Y : 200 nanometers
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Maximum depth of view Z (depends on the objective): about 1000 microns
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Three channel Spectrometer detector for high quality spectral image series
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Polarizer-Analyzer Attachment
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Location
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Micro-fabrication Laboratory, NL-1, Department of Mechanical Engineering,
IIT Kanpur
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Contact
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Prof. P.K. Panigrahi
This email address is being protected from spambots. You need JavaScript enabled to view it.
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User Charges
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Free
Note: A slot has to be booked for using the machine
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