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Profilometry renders information about the surface features and topography of the surface. In conventional contact mode profiling, a mechanical stylus comes in contact with the surface to trace the surface features, which is time consuming method and tends to alter/damage the surface features. On contrary, non-contact optical profilometer is able to trace the surface topography and quantify the roughness without damaging the actual surface features. It utilizes optical light interference principles to scan and quantify topographic features of various materials ranging from hard ceramics/metals to soft polymers or biological cells.
Important features of non-contact profilometer are:
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Green Light Source as standard (high resolution imaging) + White Light Interferometry.
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Spatial Sampling of 40 nm. Up to 0.3 - 0.5 μm lateral resolution
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Objectives of 50X + 2X Zoom lens + High Resolution Camera (1280 X 960 pixels).
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Maintains the same pixels to provide high resolution images even at high magnification.
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Can work in both phase-shift mode and vertical-shift mode.
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Advanced software included to stitch images into large collage.
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Can work in very wide environment conditions.
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