ZSX Primus II Wave length Dispersive X-Ray Fluorescence Spectrometer

 

XRF is used to determine chemical composition of all kinds of materials. The materials can be in solid, liquid, powder, filtered or other form. The method is fast, accurate and non-destructive, and usually requires only a minimum of sample preparation. Applications are very broad and include the metal, cement, oil, polymer, plastics, and food industries, along with mining, mineralogy and geology, and environmental analysis of water and waste materials.

In XRF, X-Rays produced by irradiate the sample. In most of the cases, the source is an X-rays tube but alternatively it could be synchrotron or a radioactive material. The elements present in the sample will emit fluorescent X-ray radiation with discrete energies that are characteristics for these elements. A different energy is equivalent to a different color. By measuring the energies of the radiation emitted by the sample it is possible to determine which elements are present. This step is called Qualitative analysis. By measuring the intensities of the emitted energies it is possible to determine how much of each element is present in the sample. This step is called Quantitative Analysis.

Our WD-XRF system can detect elements from Na to U. The concentration range goes from ppm levels to 100%. Generally speaking, elements with high atomic numbers have better detection limits than lighter elements.

Specification

X-ray Spectrometer assembly tube consisting of: X-ray generator 4kW , 60kV-150mA
Primary beam filters with Al25, Ti20, Cu25, Zr150
6 position diaphragm
(35, 30, 20, 10, 1, 0.5mm φ)
Divergence Slit : 3 positions
Receiving Slit : For SC , for F-PC
Goniometer
Angular Ranges for detectors : SC: 5˚ -118˚ , F-PC 13˚ -148˚
Max Scan Speed : 1400˚ /Min ( 2 )
Angular Reproducibility : + 0.0005˚
Continues Scan : 0.1 – 240 ˚ / Min
Detector : For heavy elements SC , Counting linearity : 1000kcps
Detector: For light elements F-PC, Counting linearity : 2000kcps
Attenuator : IN – OUT Automatic Exchange ( Attenuation 1/10)
3 position slit changer with coarse and fine slit
Windows XP Software with SQX including Library

Location:


X-Ray Fluorescence Laboratory Room No. 101, ACMS Building
IIT Kanpur

Contact:


Prof. Debajyoti Paul

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User Charges:


IIT Kanpur users
INR. 1000 per sample (10 Major element oxides & 20 selected trace elements)Outside IITK users
INR. 1200 per sample (10 Major element oxides & 20 selected trace elements)Industry & Consultancy Work
INR. 2000 per sample (10 Major element oxides & 20 selected trace elements)
(Service tax is applicable for outside IITK users)