Optical Profilometry Lab
Location: ACMS 110
Instrument:
Optical Profilometer
Model/Supplier: Bruker Contour GT-K
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This Optical Profilometer are interference microscope used for accurate
surface profiling measurements. It measures height variations such as
surface roughness,coating or film thickness, step height,wear volume and
other along with high- resolution image in 2D & 3D. This profilometer
comes with dual-LED illuminated optical module with available objective
2.5X, 20X,50X and capable stitching with motorized XY stage. Max. scan
range up to 10mm with vertical resolution <0.01nm. |
CONTACT
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