About instrument (Carl Zeiss EVO 50)

Scanning Electron Microscope is a versatile analytical microscope with a large specimen chamber and can handle large specimens at the analytical working distance of 8.5mm owing to a combination of the inclined detectors and the sharp conical objective lens.

ENERGY DISPERSIVE X-RAY MICROANALYSIS

Microstructures at SEM can be analyzed for its elemental composition in more detail using EDX system. This is a non-destructive analysis and the elements and their concentration in the sample can be determined reasonably accurately. EDS (EDX) Analysis provides elemental/Phase composition analysis of a sample inside a SEM. Also microstructural analysis i.e. EBSD (Electron BackScatter Diffraction Analysis) can be done to characterize grain structures. INCA and AZtec from Oxford is a new and revolutionary materials characterization system that gathers accurate data at the micro- and nanoscales

About instrument (Nova NanoSEM 450)

The Nova NanoSEM is a field-emission scanning electron microscope (FE-SEM), which attains ultra-high imaging resolution. The NanoSEM Schottky field-emission source allows the user to achieve high imaging resolution at a range of 0.2-30 kV, at both low (high-resolution imaging) and high (micro analytical imaging) currents. Secondary electron (SE) imaging can be undertaken in both field-free and immersion mode for comprehensive low-to-high resolution imaging of a variety of samples. The Nova NanoSEM is configured with a Bruker SDD-EDS detector and can be manually fitted with a backscattered electron detector for the convenient visualization of compositional differences across the specimen surface