Advanced Imaging Centre

FEI-Titan G2 60-300 KV TEM!

Manufacturer: ThermoFisher Scientific
Model: FEI Titan G2 60 -300 TEM
Holder: Single tilt, Double tilt
60–300 kV
Atomic Resolution in TEM and STEM Mode
Selected Area Electron Diffraction
HAADF Imaging
Fast EDS Analyser using Super X-SDD Detector
Lorentz Lens
True Imaging Focal Series Reconstruction
X- FEG Unit 300 kV

Description: The FEI Titan G2 60-300 scanning transmission electron microscope (STEM/TEM) is an advanced analytical field emission scanning transmission electron microscope for the characterization and chemical analysis of wide range of materials and nanostructures, down to the atomic level. It is equipped with a high-brightness Schottky-field emission electron source, a high-resolution Gatan Imaging Filter (GIF), and X-ray energy dispersive spectrometer (EDS) for elemental and chemical analysis of materials at high spatial resolution. The microscope system also includes a high angle annular dark field detector (HAADF) for scanning transmission electron microscopy (STEM) and for chemical analysis of very small volumes. This instrument permits access to get critical information during imaging by exploiting diverse range of analytical, heating, cooling, and double tilt specimen holders. Useful in determining localization, orientation, shape & distribution.

FEI-Tecnai G2 12 Twin 120 KV TEM!

Manufacturer: ThermoFisher Scientific
Model: FEI TECHNAI G2 12 Twin TEM
Holder: Single tilt
20 kV–120 kV
High Contrast Cryo – TEM
Low dose imaging for sensitive samples
3D Tomography
3D Reconstruction

The Tecnai is an efficient and easy operation microscope with excellent analytical capabilities. It uses LaB6 filament as electron source and could be exploited for the analysis of wide variety of samples ranging from materials to biological at room temperature as well as cryo-temperature.

Precision Low Speed Saw

Manufacturer: Allied High Tech Products
Model: Tech Cut 4
Variable speed: 10–500 RPM (in increments of 10 RPM)
Micrometer sample indexing, 0.002 mm resolution, 0-25 mm range
Wafering Diamond Blade 3-6" (75-150 mm), 0.5" (12.7 mm) arbor hole
Cutting capacity: 2" (51 mm) thickness
Multiple Sample Chucks
Built in Micrometer Adjustment for Sample Thickness
Counterbalanced Cutting Forces

The TechCut-4 is a compact, multipurpose precision low speed saw designed to cut wide variety of small or delicate samples which cannot sustain at elevated temperature generated due to friction caused by high speed sectioning. The pivoting cutting arm has adjustable weights to apply or counterbalance downward force to the sample during sectioning. Cutting fluid is drawn from the reservoir by the blade to cool the sample. Samples up to 2" thickness can be sectioned by using a 3" to 6" blade range.

Variable Speed Polisher/Grinder

Manufacturer: Allied High Tech Products
Model: MetPrep 3
Ideal for Gentle Specimen Polishing using Diamond Paste or Diamond Lapping Films
Rotation Speed 5- 350 RPM
Accepts Aluminium and Glass Platens
Suitable for Slow Speed Grinding
Water Supply and Splash Guard

The MetPrep-1 grinding/polishing machine is excellent for polishing delicate samples using handheld tools with lapping films. It features digital control of all operations including run/stop, platen speed, platen direction and coolant flow. It includes 8" or 10" platens with rotation speed ranges from 5-350 RPM, in either clockwise or counterclockwise direction, with smooth, consistent low-end torque.

PowerTome PC ultramicrotome

Manufacturer: RMC
Model: PowerTome PTPCZ
Auto thin sectioning from 1nm
Auto thick sectioning to 15µm
Cutting speed range from 0.1 – 100mm/sec
Specimen auto feed 200µm
Variable return speed over entire cutting speed range
High precision manually operated knife stage with 30mm lateral and 12mm forward motion
Room Temperature sectioning
Cryo - Temperature sectioning

Description: PowerTome Ultramicrotome (including Cryo-ultramicrotome) is a computer controlled ultramicrotome used for the preparation of ultrathin/semi-thin sections as well as very flat surfaces of plastics, biological and biomedical objects for various microscopic investigations. This machine offers automatic sectioning range from 5nm to 15µm with cutting speed range from 0.1 – 100mm/sec and there is a digital section counter and feed totaliser.

Ultrasonic Disk Cutter

Manufacturer: Fischione Instruments
Model: 170
Ultrasonic cutting
Rapidly cuts disks, rods, or rectangular specimens
Lead Zirconate Titanate Crystal oscillating at a frequency of 26kHz
Precise location of the cutting site
Disk cut in manual or automatic mode
Minimal mechanical and thermal damage
Thin specimens (>10 µm) or thick (<1 cm)
Automatic termination

Description: The Ultrasonic Disk Cutter readily cuts transmission electron microscopy (TEM) specimens from hard, brittle materials without mechanical or thermal damage. It produces disk specimens from materials as thin as 10 µm or cylindrical rods up to 10 mm long from bulk samples or rectangular wafers that are subsequently used in the preparation of cross-section TEM specimens. The cutting tool movement is governed by the excitation of lead zirconate titanate crystals oscillating at a frequency of 26 kHz. The cutting medium is abrasive slurry of either boron nitride or silicon carbide.

Dimpling Grinder

Manufacturer: Fischione Instruments
Model: 200
Controlled thinning rate
Precise and Easy to use
Automated operation
Alignment microscope
Site specific thinning
Single- or double-sided dimpling

Description: Dimpling Grinder is a state-of-the-art mechanical grinder required to prethins specimens for ion milling for preparing electron microscopy samples. Dimpling is a rapid technique that involves rotating both the grinding wheel and the specimen, produces a specimen with only its central area reduced to a thickness of a few microns. The dimpling grinder features grinding rate control, a precise indication of specimen thickness, and an easy-to-use interface. The specimen can be accurately positioned using an optical microscope with transmitted and/or reflected light. The final specimen thickness is readily programmed for accurate, unattended operation.

TEM Mill/ Precision Ion Polishing System (PIPS)

Manufacturer: Fischione Instruments
Model: 1050
Two independently adjustable TrueFocus ion sources
High energy operation for rapid milling
low energy operation for specimen polishing
Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 6 keV)
Simple setup of milling parameters
Individual, automatic ion source gas control
Continuously adjustable milling angle range of ‒10 to +10˚
Specimen rocking or rotation with ion beam sequencing
Automatic termination

Description: TEM Mill is a state-of-the-art ion milling and polishing system offering reliable, high performance specimen preparation. It is compact, precise, and consistently produces high-quality transmission electron microscopy (TEM) specimens with large electron transparent areas from a wide variety of materials. It is equipped with two independently adjustable TrueFocus ion sources working over a wide range of operating energies (100 eV to 10 keV) and adjustable milling angle range of -15 to +10°. These variables could be exploited for the rapid milling and slow specimen polishing of TEM specimens.

Vitrobot!

Manufacturer: TheroFisher Scientific
Model: Vitrobot Mark IV
Working temperature: 4–60° C (at an ambient temperature range between 18–25° C)
Peltier controlled heating/cooling
Maintain relative humidity at 100%
Ultrasonic controlled humidification

Description: The Vitrobot is a semi automated device for vitrification (plunge freezing) of aqueous samples. Critical vitrification parameters, such as temperature, relative humidity, blotting pressure and time, can be precisely controlled. A simple touch-screen user interface and programmable process control allow for consistent and high-yield sample output.

Specimen Punch

Manufacturer: Fischione Instruments
Model: 130
Punch 3mm and 2.3mm disk
Without base
With base
< 100 um thick foil between punch and die

Description:

Plasma Cleaner

Manufacturer: Fischione Instruments
Model: 1020
Simultaneously cleans transmission and scanning electron microscope specimens and specimen holders
Enhances imaging and analytical results
Removes existing carbonaceous contamination
Prevents contamination
No etching or sputtering
Storage in clean vacuum
ICP “Cold” Plasma using Ar / 25% O2
10 – 12 eV ion energies
Chemical removal of contamination
No heating or sputtering of sample material

Description: Plasma Cleaner automatically and quickly removes organic contamination (hydrocarbon) from electron microscopy specimens and specimen holders. A low energy, reactive gas plasma cleans without changing the specimen’s elemental composition or structural characteristics. The Plasma Cleaner features easy-to-use front panel controls and an oil-free vacuum system for optimal processing.

Automatic Twin-JetElectropolisher

Manufacturer: Fischione Instruments
Model: 110
Electrolytic polishing or chemical etching
Simultaneous two-sided polishing
No induced artifacts
Easily adjustable flow rate, jet and specimen positions
Reliable, accurate termination
Controlled electrochemical removal of material from the specimen
Electropolishing controlled by: Composition of the electrolyte, Temperature of the electrolyte, Flow Rate of the electrolyte, Applied electrical potential, Adjustment of auto termination device, Number of jets

Description: Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The electropolisher features easily adjustable electrolyte flow, polishing voltage, termination detection sensitivity, and jet and specimen holder positions.