Equipment
Characterization Tools
- Atomic Force Microscopy (AFM)
- Particle Size Analyzer
- Contact Angle Goniometer
- Nulling Ellipsometry and Microscopy
- 3D Profilometers (mechanical and optical)
- UV-KUB
- Fourier-Transform Infrared Spectroscopy (FTIR)
- UV-Visible Spectro Photometer
- X-ray Diffractometer (XRD)
- Field Emission Scanning Electron Microscope (FESEM)
- Imaging and Spectroscopic Ellipsometry
- NKD film thickness analysis
- Micro-Raman
- Optical and Fluorescence Microscopes
Fabrication Tools
- Maskless Photolithography SF Express
- Maskless Photolithography SF 100
- RF Sputtering
- Reactive Ion Etching
- Languir-Blodgett Deposition
- Solution spin, Flow Coating and Electrospinning
- UV Lithography
- Nanoimprint lithography
- High temperature furnaces
- FESEM coupled with Electron Beam Lithography
- Molecular Printer
- Ball Mill
- E-beam and thermal evaporation