Atomic Force Microscopy (AFM)

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Atomic Force Microscopy (AFM)

Force Microscopy is combined with the Piezoresponse Force Microscopy (Electronic Response of Materials) and Magnetic force microscope (Magnetic Response of Materials.

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Equipment 1

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Equipment 2

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Contact person

Prof. Ashish Garg

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Materials science, Life science, Polymers, Nanolithography, Electrical/magnetic measurements and Nanoindenting.

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FM
PFM
MFM

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Material Science & Engineering
Indian Institute of Technology, Kanpur 208016
Tel: +91 - (0)512 - 2597904, 2597263
Fax: +91- (0)512 - 2597505 or 2596621
Email: This email address is being protected from spambots. You need JavaScript enabled to view it.
Office: WL-104

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WL - 104

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10.00 AM to 01.00 PM
02.00 PM to 05.00 PM

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