Atomic Force Microscope and Scanning Tunneling Microscope
Department houses an Atomic Force Microscope (AFM) and a Scanning Tunneling Microscope (STM). These include X/Y motion controls, scanners, high-resolution probes/tips, and detectors having a control systems. This facility is used for general surface characterization of solids, polymers, and other samples and is housed in an environment free from acoustic and vibration noise.
Contact Person
- Prof. T. Gopakumar
- Dr. A.K.M