Electronically controlled sensors: LVDTs/DCDTs, strain gauges, Velocity Meters (induction type) and Accelerometers (both force balance and capacitive types)Traditional devices: Dial gauges and proving rings
PC-Based Data Acquisition System of different capabilities
System 5000 from Measurements Group Inc., USA.
60 channel data from strain gauges, LVDTs, load cells and transducers.
High performance PXI based from National Instruments, USA.
128-channels, 16-bit, for fast dynamic tests for zero channel skew at 200 samples per second.
Contact Person
- K. K. Bajpai
Research:
List of Testing1.Bending and torsion Test
2.Frame buckling Test
3.Cyclic Inelastic Buckling Of Steel Braces Test
4.Free Vibration Test