Prerequisites:

Course Contents 

Concepts and language of stereology; geometrical probability; fundamental operations in stereology; averaging with respect to orientation; basic stereological parameters on true 2D sections and thick sections; topological parameters of microstructure; error analysis; applications of analysis of optical, scanning and transmission electron micrographs; numerical density and size distribution of particles and grains of various shapes and sizes; stereological analysis of anisotropic microstructures; fractal description of various microstructures; fractal dimensions and its significance; applications to characterization of martensitic, polycrystalline and other structures and fracture surfaces.

Topics